Patent · US Expired

Structure and method for improved heat conduction for semiconductor devices

US7345364B2 · kind B2 · utility

21Cited by
11References
46Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 30, 2004
Grant dateMar 18, 2008
Priority date
Expiry dateMay 11, 2025

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/13091
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A thermally conductive structure for a semiconductor integrated circuit and a method for making the structure. The structure comprises one or more vertical and/or horizontal thermally conductive elements disposed proximate a device for improving thermal conductivity from the device to a substrate of the integrated circuit. In one embodiment a heat sink is affixed to the integrated circuit for heat flow from the integrated circuit. The method comprises forming openings in material layers overlying the semiconductor substrate, wherein the openings are disposed proximate the device and extend to the substrate. A thermally conductive material is formed in the openings to provide a thermal path from the device to the substrate.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.