Patent · US Expired

Semiconductor device having semiconductor chip on base through solder layer and method for manufacturing the same

US7345369B2 · kind B2 · utility

0Cited by
3References
6Claims
0Family size

Assignees

Inventors

Key dates

Filing dateOct 13, 2005
Grant dateMar 18, 2008
Priority date
Expiry dateOct 13, 2025

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/181
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A semiconductor device includes: a base member; a solder layer; and a semiconductor chip disposed on the base member through the solder layer. The chip has an in-plane temperature distribution when the chip is operated. The chip has an allowable maximum temperature as a temperature limit of operation. The in-plane temperature distribution of the chip provides a temperature of the chip at each position of a surface of the chip. The temperature margin at each position is obtained by subtracting the temperature of the chip from the allowable maximum temperature. The solder layer has an allowable maximum diameter of a void at each position, the void being disposed in the solder layer. The allowable maximum diameter of the void at each position becomes larger as the temperature margin at the position becomes larger.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.