Optical system for imaging distortions in moving reflective sheets
US7345698B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 28, 2003 |
| Grant date | Mar 18, 2008 |
| Priority date | — |
| Expiry date | Apr 2, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B11/306
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and apparatus for detecting and measuring the optical distortion in pieces of glass and other reflective sheets are disclosed. The method inspects the full length and width of large area glass sheets or multiple sheets comprising a load of glass and uses optical magnification of a reflected circular image of precise size. A plurality of circular images is projected onto the glass and reflect as ellipsoids representative of local surface contours. The major and minor axes of the reflected axis define the axis of greatest magnification and demagnification. Distortions in the glass surface are measured in lens power as localized magnification at the elliptical axis. The angle and magnitude of the minor and major axis of the reflected ellipsoids provide data to map the surface profile of the glass. The method measures distortion of random or periodic frequency and measures distortion in all axes.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.