Methods and system for inspection of fabricated components
US7346999B2 · kind B2 · utility
2Cited by
19References
20Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jan 18, 2005 |
| Grant date | Mar 25, 2008 |
| Priority date | — |
| Expiry date | Mar 23, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B7/28
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Methods and apparatus for inspecting a component are provided. The method includes receiving a plurality of data points that define a shape of the component, fitting the received data points to a curve that defines a predetermined model shape, and comparing the received data points to the curve defining the predetermined model shape to determine a break radius of the component.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.