Patent · US Expired

Synchronized analyte testing system

US7347973B2 · kind B2 · utility

185Cited by
22References
10Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 4, 2003
Grant dateMar 25, 2008
Priority date
Expiry dateApr 12, 2025

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S435/817
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

An analyte detection system is provided with calibration information uniquely specific to the set of test strips to which the sample is to be applied. The calibration information may be stored in permanent memory of the testing device, such that the device is discarded after use of all the test strips in a kit, or it may be stored in a calibration chip accompanying the set of test strips and distributed therewith, thereby enabling re-use of the testing device with a different set of test strips and associated calibration chip.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.