Aspects of mass spectral calibration
US7348553B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 28, 2005 |
| Grant date | Mar 25, 2008 |
| Priority date | — |
| Expiry date | Apr 29, 2026 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J49/0009
- WIPO fieldChemical engineering
- WIPO sectorChemistry
Abstract
A method for calibrating and analyzing data from a mass spectrometer, comprising the steps of acquiring raw profile mode data containing mass spectral responses of ions with or without isotopes; calculating theoretical isotope distributions for each of at least one calibration ion based on elemental composition; convoluting the theoretical isotope distributions with an initial peak shape function to obtain theoretical isotope profiles for each ion; constructing a peak component matrix including the theoretical isotope profiles for calibration ions as peak components; performing a regression analysis between the raw profile mode mass spectral data and the peak component matrix; and reporting the regression coefficients as the relative concentrations for each of the components. A mass spectrometry system operated in accordance with the method and a computer readable medium having program code thereon for performing the method.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.