System and method for memory element characterization
US7350170B2 · kind B2 · utility
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6References
16Claims
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Key dates
| Filing date | Jun 1, 2005 |
| Grant date | Mar 25, 2008 |
| Priority date | — |
| Expiry date | Jun 2, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F30/3312
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A system and method for analyzing a memory element includes modeling the memory element using a simulation method and determining component response characteristics for components of the memory element. Safety regions are computed in a state space of the memory element, which indicate stable states. A transient analysis is performed to determine a path and time needed to reach one of the safety regions. Based on the path and time needed to reach one of the safety regions, a clock waveform or waveforms are determined which place a corresponding state in that safety region.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.