Atmospheric refractivity profiling apparatus and methods
US7353690B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 24, 2005 |
| Grant date | Apr 8, 2008 |
| Priority date | — |
| Expiry date | Feb 19, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01K11/006
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Apparatus and methods for characterizing atmospheric refractivity and its evolution in time and space utilizing passive radiation emission measurement devices are disclosed. Based on an instrument such as a passive microwave radiometer, ancillary meteorological measurements and other information and observations, the apparatus and methods provide useful signatures for characterizing atmospheric refractivity. The system can observe to any vector in the sky, giving directional as well as zenithal measurements of the refractivity profile, its spatial and temporal gradients, and the spatial and temporal trending of the profile and its gradients.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.