Patent · US Expired

High throughout screening method and apparatus

US7354704B2 · kind B2 · utility

6Cited by
11References
9Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 29, 2002
Grant dateApr 8, 2008
Priority date
Expiry dateOct 29, 2022

Classification

  • Technology area (CPC C)Chemistry; Metallurgy
  • CPC primaryC40B60/14
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

High-throughput screening method and apparatus arm described. The method includes placing cells on a substrate defining a plurality of discrete microwells, at a well density of greater than about 100/cm2, with the number of cells in each well being less than about 1000, and where the cells in each well have been exposed to a selected agent. The change in conductance in each well is determined by applying a low-voltage, AC signal across a pair of electrodes placed in that well, and synchronously measuring the conductance across the electrodes, to monitor the level of growth or metabolic activity of cells contained in each well. Also disclosed is an apparatus for carrying out the screening method.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.