Patent · US Expired

Scene imaging system integrity monitor and method thereof

US7355179B1 · kind B1 · utility

18Cited by
3References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 30, 2005
Grant dateApr 8, 2008
Priority date
Expiry dateMay 11, 2026

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06T2207/30252
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A scene imaging system (SIS) integrity monitor for monitoring the required operation of an imaging sensor of an SIS. The SIS is of a type including: i) an imaging sensor, ii) an imaging system processor, and iii) an imaging system display. The SIS integrity monitor includes a signal emitter assembly for receiving emitter drive signals from an imaging system processor and directing a monitoring image into the active field of view of an imaging sensor for sensed image generation. The generated image is provided to the imaging system processor for analysis. The imaging system processor evaluates the location and modulation state of the generated image to determine if faults exist in the image generation or image display paths.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.