System and method of SAR management for an MR scan
US7355404B1 · kind B1 · utility
8Cited by
6References
21Claims
0Family size
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Key dates
| Filing date | Dec 13, 2005 |
| Grant date | Apr 8, 2008 |
| Priority date | — |
| Expiry date | Dec 13, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R33/288
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and apparatus for RF deposition prediction model refinement measures an RF parameter during a scan and refines the RF deposition prediction model by a correction factor based on the measured RF parameter.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.