Patent · US Active

Method and magnetic resonance imaging apparatus for planning an examination of a subject

US7355406B2 · kind B2 · utility

1Cited by

4References

10Claims

0Family size

Assignee

Siemens Aktiengesellschaft · DE

Inventors

Klaus Mayer · Prien am Chiemsee, DE
Cecile Mohr · Erlangen, DE
Mike Muller · Steinfeld (Oldenburg), DE

Key dates

Filing date	Jul 7, 2006
Grant date	Apr 8, 2008
Priority date	—
Expiry date	Sep 27, 2026

Classification

Technology area (CPC G)Physics
CPC primaryG01R33/56383
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

In a method for planning an examination of an examination subject in a magnetic resonance system, wherein images of different regions of the examination subject are acquired that are assembled into an overall image, the position of at least one first image in the examination subject, the measurement parameters for this at least one MR image are established, the position of at least one second image in the examination subject is determined, the measurement parameters for the at least one second image are established, and the measurement parameters that are dependent measurement parameters are determined. With these dependent measurement parameters the measurement parameters in the images are set (adjusted) such that they are identical for all images.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.