Decision selection and associated learning for computing all solutions in automatic test pattern generation (ATPG) and satisfiability
US7356747B2 · kind B2 · utility
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4Claims
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Key dates
| Filing date | Aug 2, 2005 |
| Grant date | Apr 8, 2008 |
| Priority date | — |
| Expiry date | Mar 1, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/318307
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An all solutions automatic test pattern generation (ATPG) engine method uses a decision selection heuristic that makes use of the “connectivity of gates” in the circuit in order to obtain a compact solution-set. The “symmetry in search-states” is analyzed using a “Success-Driven Learning” technique which is extended to prune conflict sub-spaces. A metric is used to determine the use of learnt information a priori, which information is stored and used efficiently during “success driven learning”.
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