Method for performing a measurement inside a specimen using an insertable nanoscale FET probe
US7357018B2 · kind B2 · utility
17Cited by
12References
8Claims
0Family size
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Key dates
| Filing date | Feb 10, 2006 |
| Grant date | Apr 15, 2008 |
| Priority date | — |
| Expiry date | Feb 10, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01Q60/42
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A measurement inside a specimen is performed by providing a nanoscale FET probe comprising a cantilever element and a nanowire extending from the cantilever element. The nanowire is electrically connected to the cantilever element at at least one of the ends of the nanowire. The nanowire is coated along at least part of the length thereof with molecules of a capture agent. The cantilever element is moved to insert the nanowire onto the specimen. An electrical property of the nanoscale FET probe is monitored to detect binding events between the capture agent molecules and an analyte of interest inside the specimen.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.