Strip planarity measuring method and apparatus
US7357022B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Feb 14, 2005 |
| Grant date | Apr 15, 2008 |
| Priority date | — |
| Expiry date | Nov 11, 2025 |
Classification
- Technology area (CPC B)Performing Operations; Transporting
- CPC primaryB21B37/28
- WIPO fieldMachine tools
- WIPO sectorMechanical engineering
Abstract
A method and a surface evenness measuring roller for determining surface evenness measurement errors in steel and metal band comprising at least one measuring head having part measuring heads which part measuring heads are integrated respectively offset by 180° into the roller mantel and supported on two force transmitters and are further separated from the roller mantle by means of a circumferential motion gap and are braced with respect to one another by means of at least one tie rod wherein in the course of a measurement of the band tensile stress distribution over the whole band width the band with band is subject to tension over its whole band width wraps around the surface evenness measuring roller with a predetermined arc of contact and thereby exerts pressing forces onto the surface evenness measuring roller from which pressing forces can be determined the band tension distribution.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.