Methods and apparatus of spatially resolved electroluminescence of operating organic light-emitting diodes using conductive atomic force microscopy
US7358490B1 · kind B1 · utility
2Cited by
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20Claims
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Key dates
| Filing date | May 26, 2005 |
| Grant date | Apr 15, 2008 |
| Priority date | — |
| Expiry date | Mar 18, 2026 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10S977/851
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A conductive atomic force microscopy (cAFM) technique which can concurrently monitor topography, charge transport, and electroluminescence with nanometer spatial resolution. This cAFM approach is particularly well suited for probing the electroluminescent response characteristics of operating organic light-emitting diodes (OLEDs) over short length scales.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.