Probing apparatus, probing circuit board and probing system for high-voltage matrix probing
US7358753B2 · kind B2 · utility
2Cited by
13References
32Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Sep 27, 2006 |
| Grant date | Apr 15, 2008 |
| Priority date | — |
| Expiry date | Oct 7, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2808
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A probing apparatus, probing circuit board and probing system for high-voltage matrix probing are provided. Switching circuits of the probing apparatus capable of probing a plurality of probing points for high-voltage matrix probing are manufactured with using a mixed high-voltage IC process. The probing circuit board comprises a plurality of probing apparatuses integrated on a bare circuit board. The probing system comprises a plurality of probing circuit boards integrated in a machine.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.