Display apparatus and inspection method
US7358757B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Jun 21, 2006 |
| Grant date | Apr 15, 2008 |
| Priority date | — |
| Expiry date | Jun 21, 2026 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10S345/904
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
The test circuit of a display apparatus according to the invention detect short-circuiting in each of the data lines Dn by inputting the electric potential Vd of the data line Dn connected to the corresponding one of high resistance first short-circuiting detecting resistors Tr1n connecting a predetermined electric potential and the data line Dn to the corresponding one of first detector logic circuits and binarizing and outputting the input electric potential Vd of the data line Dn by referring to a predetermined threshold value and also detect short-circuiting in each of the gate lines Gm by inputting the electric potential of the gate line Gm connected to the corresponding one of high resistance second short-circuiting detecting resistors connecting a predetermined electric potential and the gate line Gm to the corresponding one of second detector logic circuits and binarizing and outputting the input electric potential of the gate line by referring to a predetermined threshold value. The defects (short-circuits) produced in the process of manufacturing the display apparatus can be inspected by a simple technique.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.