Method and apparatus for measuring small shifts in optical wavelengths
US7359057B2 · kind B2 · utility
24Cited by
56References
34Claims
0Family size
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Inventor
Key dates
| Filing date | Aug 26, 2005 |
| Grant date | Apr 15, 2008 |
| Priority date | — |
| Expiry date | Dec 18, 2025 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY02A90/10
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and apparatus for detecting small shifts in optical wavelength is provided. Light having a known wavelength is directed towards a target volume in the atmosphere. Light reflected from the target volume is received and mixed with differentially delayed copies of itself to produce three interference signals. The interference signals are taken at delays spanning one-half the wavelength of the transmitted signal. The intensity of the signal at the three different delays is measured simultaneously, from which the wavelength of the reflected signal can be determined.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.