Detection and analysis of lesions in contact with a structural boundary
US7359538B2 · kind B2 · utility
17Cited by
12References
62Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Sep 30, 2002 |
| Grant date | Apr 15, 2008 |
| Priority date | — |
| Expiry date | Feb 2, 2024 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10S128/922
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
An algorithm is disclosed that detects and analyzes possible lesions that are left in contact with a structural boundary. A morphological closing with a structuring element is performed along the boundary to detect lesions within the threshold of the structuring element. A deformable surface-based analysis is performed on distinctive surfaces of the structure for the identification of lesions. The integrated use of a deformable surface model and chamfer distance potential enables explicit representation of regularized, or smoothed, surfaces from which lesion candidates may be detected.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.