Method for carrying out quality control on an analytical process and device for carrying out said method
US7359806B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 22, 2003 |
| Grant date | Apr 15, 2008 |
| Priority date | — |
| Expiry date | Oct 22, 2023 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG16H70/60
- WIPO fieldMedical technology
- WIPO sectorInstruments
Abstract
A method is proposed for carrying out quality control on an analytical process which belongs to a group of related analytical processes that can be executed in at least one analytical device and includes a respective chain of sub-processes. The method includes fundamental chemical and/or physical underlying sub-processes being stored for the group in a first database. Further, at least one section of the chain of the analytical process is emulated by the specification of one of the underlying sub-processes for each sub-process in a section of the chain, using at least one control parameter and at least one corresponding threshold value. Finally, measured values are determined for the control parameters for at least one run of the analytical process and the measured values are compared with the corresponding threshold values for the quality control procedure.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.