Patent · US Active

In-cycle system test adaptation

US7359820B1 · kind B1 · utility

6Cited by

4References

5Claims

0Family size

Assignee

International Business Machines Corporation · US

Inventors

Michael E. Browne · Hyde Park, US
Andrew P. Wack · Millbrook, US
Monica J. Lemay · Cedar Park, US
Derwin D. Gavin · Austin, US

Key dates

Filing date	Jan 3, 2007
Grant date	Apr 15, 2008
Priority date	—
Expiry date	Jan 3, 2027

Classification

Technology area (CPC G)Physics
CPC primaryG06F11/3688
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

Disclosed are a method, information processing system and computer readable medium for performing a system test on a program. The method comprises creating a test plan associated with a system test. The system test is for testing a program within an environment. At least one test trigger to be monitored for during the system test is defined within the test plan. Execution of the system test on a system under test for the at least one test trigger is monitored. An occurrence of the at least one test trigger is determined. The test plan is modified to take into account the occurrence of the at least one test trigger in response to determining the occurrence. Execution of the system test is continued based on the modified test plan.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.