RFID device variable test systems and methods
US7359823B2 · kind B2 · utility
11Cited by
20References
27Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | May 25, 2005 |
| Grant date | Apr 15, 2008 |
| Priority date | — |
| Expiry date | May 25, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06K19/0701
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Systems and methods are disclosed herein to provide variable test techniques for RFID devices. For example, in accordance with an embodiment of the present invention, a radio frequency identification (RFID) test system includes an RFID reader adapted to provide an RF signal to an RFID device, wherein a signal level of the RF signal changes as the RFID device moves through a test region. The performance level of the RFID device is determined based upon the number of times the RFID device responds to the RF signal.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.