Method of determining at least one marking element on a substrate
US7360716B2 · kind B2 · utility
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4Claims
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Key dates
| Filing date | Mar 25, 2004 |
| Grant date | Apr 22, 2008 |
| Priority date | — |
| Expiry date | Oct 28, 2024 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH05K2201/09918
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A method of establishing at least one marking element on a substrate (1). By means of design data of the substrate (1) at least a fictitious marking element (5) on the substrate (1) is determined. The fictitious marking element (5) should then be unique for a predefined area of the substrate (1). The fictitious marking element is obtained by selecting at least two transitions (6, 7, 17, 18) of at least one element on the substrate while the transitions (6, 7, 17, 18) enclose an angle to each other.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.