Analytical instruments, assemblies, and methods
US7361890B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Jun 30, 2005 |
| Grant date | Apr 22, 2008 |
| Priority date | — |
| Expiry date | Jan 3, 2026 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J49/04
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
Instrument assemblies including a support coupled to an active substrate are provided with the support being configured to be coupled to an interior portion of an ionization chamber. Instruments are also provided that can include a chamber being configured to contact at least a portion of a sample with an ionization species. The instruments can also include an active substrate within the chamber. Analysis methods are provided that can include providing a sample to a chamber and selectively retaining at least a portion of the first analyte of the sample within the chamber without retaining at least a portion of the second analyte within the chamber. Analysis methods can also include providing a sample to a chamber housing an active substrate, contacting at least a portion of the sample with the substrate, and ionizing the portion of the sample.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.