Far-field optical microscope with a nanometer-scale resolution based on the in-plane image magnification by surface plasmon polaritions
US7362440B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 24, 2005 |
| Grant date | Apr 22, 2008 |
| Priority date | — |
| Expiry date | Apr 26, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2021/178
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A far-field optical microscope capable of reaching nanometer-scale resolution using the in-plane image magnification by surface plasmon polaritons is presented. The microscope utilizes a microscopy technique based on the optical properties of a metal-dielectric interface that may, in principle, provide extremely large values of the effective refractive index neff up to 102-103 as seen by the surface plasmons. Thus, the theoretical diffraction limit on resolution becomes λ/2neff, and falls into the nanometer-scale range. The experimental realization of the microscope has demonstrated the optical resolution better than 50 nm for 502 nm illumination wavelength.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.