Patent · US Expired

Tomography appliance, and method for a tomography appliance

US7362844B2 · kind B2 · utility

1Cited by

8References

31Claims

0Family size

Assignee

Siemens Aktiengesellschaft · DE

Inventors

Bjoern Heismann · Erlangen, DE
Silke Janssen · Heroldsbach, DE

Key dates

Filing date	Aug 15, 2005
Grant date	Apr 22, 2008
Priority date	—
Expiry date	Mar 19, 2026

Classification

Technology area (CPC Y)Emerging Cross-Sectional Technologies
CPC primaryY10S378/901
WIPO fieldMedical technology
WIPO sectorInstruments

Abstract

A tomography appliance and method for a tomography appliance make it possible to calculate, in a simple and efficient manner, detector-element-related coefficients of an intensity function dependent on the detector output signal and to calculate the X-ray-emitter-related coefficients of an intensity function dependent on an X-ray emitter input value. This is done on the basis of measured detector output signals and at least one X-ray emitter input value, such that the intensity which acts precisely on the respective detector element can be determined from X-ray radiation originating from the X-ray emitter.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.