Optical spectrum analyzer
US7365845B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 24, 2006 |
| Grant date | Apr 29, 2008 |
| Priority date | — |
| Expiry date | Jan 24, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J2003/2866
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An optical spectrum analyzer measures to-be-measured light while carrying out calibration processing for correcting wavelength information of spectrum data of the to-be-measured light by a wavelength information correction device through a storage device based on the spectrum data of reference light that is obtained by causing the reference light whose wavelength is known to be incident on a tunable wavelength filter from light incident devices at all times together with the to-be-measured light. Since the optical spectrum analyzer can continuously measure the to-be-measured light in a wide wavelength range at high speed while maintaining high wavelength accuracy, it can continuously obtain the spectrum data of the to-be-measured light with high wavelength accuracy even if it is installed in a place in which an environment intensely changes.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.