Methods and apparatus using both nuclear capture and inelastic spectroscopy in deriving elemental concentrations
US7366615B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 31, 2006 |
| Grant date | Apr 29, 2008 |
| Priority date | — |
| Expiry date | Jul 31, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01V5/125
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Methods and apparatus are provided for determining the content of a first element in a formation which cannot otherwise be determined via a capture spectrum measurement. The methods and apparatus utilize the inelastic spectrum measurement of the first element and the inelastic and capture spectrum measurements of at least a second element. The methods and apparatus have particular application to determining the carbon content of a formation although they are not limited thereto. The inelastic and capture spectrum measurements of silicon are useful in making such determinations, although other chemical elements may be used as the second element.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.