Fast calibration of electronic components
US7369813B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Nov 18, 2003 |
| Grant date | May 6, 2008 |
| Priority date | — |
| Expiry date | Oct 19, 2025 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04L2027/0016
- WIPO fieldBasic communication processes
- WIPO sectorElectrical engineering
Abstract
The number of measurements needed to calibrate an electrical device is reduced. Apparatus and methods minimize output of one or more unwanted signals by determining a calibration setting, in a minimal number of measurements, from determined distances to a best setting. Each distance to a best setting can be determined as a function of the characteristic of the unwanted signal and the measured unwanted signal level. A calibration setting point can be determined by searching for a setting point having a lowest sum of distance errors determined from the calculated distances and from the measured and non measured setting points. The techniques and apparatus are useful for minimizing a number of measurements that would be needed for determining a setting that substantially prevents generation of unwanted output signals, such as carrier leakage (LO-leakage) and unwanted sidebands, and for quickly determining whether an acceptable calibration setting exists for a device.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.