Patent · US Expired

Integrated circuit analysis method and program product

US7370308B2 · kind B2 · utility

2Cited by
6References
4Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 27, 2005
Grant dateMay 6, 2008
Priority date
Expiry dateApr 13, 2026

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F30/3312
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A method for analyzing integrated circuits (IC's) has steps of dividing the circuit into a plurality of individual blocks that are linked together. Each block is comprised of a plurality of latches and paths connecting the latches. The blocks are compressed by removing all detail not required for performing global transparency timing modeling.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.