Patent · US Expired

Device for sequential observation of samples and methods using same

US7372626B2 · kind B2 · utility

2Cited by
13References
28Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 10, 2001
Grant dateMay 13, 2008
Priority date
Expiry dateMar 21, 2023

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG02B21/26
  • WIPO fieldOptics
  • WIPO sectorInstruments

Abstract

The invention concerns methods and devices for observing or analysing samples on a support. More particularly, it concerns a device for sequential observation of several samples arranged on a common plate (19) comprising an objective (15) for observing a stage (17) for positioning the plate (19) adapted to ensure a relative displacement between the plate (19) and the observation axis in a plane perpendicular to the observation axis, while leaving free the vertical displacement along the observation axis, means (21) for illuminating the sample and means (23, 25) for acquiring an image at the objective (15) output. It comprises a spacer (43) fixed relative to the objective (15) and having a support surface (45) on the support (19), said support surface being located proximate to the observation axis, so that said spacer (43) is adapted to maintain, on the observation axis, a constant distance between the objective (15) and the observation surface (29), during a relative displacement between the support (19) and the observation axis. The invention is useful for rapid analysis of cell samples.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.