Measurement deferral and aggregation for extensible test configuration
US7372946B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Dec 11, 2003 |
| Grant date | May 13, 2008 |
| Priority date | — |
| Expiry date | Nov 29, 2026 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04M3/32
- WIPO fieldTelecommunications
- WIPO sectorElectrical engineering
Abstract
A system having a diagnostic measurement system (DMS) and method include a multi-protocol application test identifying components corresponding to protocols mixed within the multi-protocol application test, executing the protocols to collect measurements of the components, combining the measurements of the components to generate measurements corresponding to the multi-protocol application test, and outputting the measurements of the multi-protocol application test to the DMS, wherein the multi-protocol application test defers outputting the measurements of the components to the DMS as the measurements are collected from each protocol.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.