Patent · US Expired

Graphical user interface for compliance monitoring in semiconductor wafer fabrication and method of operation

US7373211B1 · kind B1 · utility

4Cited by
14References
24Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 17, 2005
Grant dateMay 13, 2008
Priority date
Expiry dateOct 17, 2025

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY02P90/02
  • WIPO fieldControl
  • WIPO sectorInstruments

Abstract

A system and method is disclosed for allocating multi-function resources among a plurality of tasks within a process system in semiconductor wafer fabrication. A resource allocator allocates multi-function resources among tasks within a process system that executes at least one application process. The resource allocator comprises a monitoring controller, model of the process system, a resource allocation controller, and a compliance-monitoring viewer. The compliance-monitoring viewer is operable to display process system information to illustrate plan compliance, information visualized over a time period of years, months, days, hours, seconds, microseconds or the like.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.