Analog-type measurements for a logic analyzer
US7373263B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 16, 2006 |
| Grant date | May 13, 2008 |
| Priority date | — |
| Expiry date | Jul 7, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R13/02
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A logic analyzer that performs analog-type measurements on digital data includes circuitry in its acquisition system that is programmable to search through acquired data to detect analog-type signal characteristics. In a first embodiment, the logic analyzer includes a graphical user interface employing a drag-and-drop operation to apply one or more selected analog-type measurements to selected portions of the digital data record. In a second embodiment, a user may designate a particular waveform or data listing by means of a mouse-click. Each of the choices of analog-type measurements can be represented by an icon, or text, or both icon and text. Some of the analog-type measurements, among others, are pulse width, duty cycle, period, frequency, period jitter, and cycle-to-cycle jitter
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.