Extended input/output measurement block
US7373435B2 · kind B2 · utility
39Cited by
31References
24Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Nov 18, 2005 |
| Grant date | May 13, 2008 |
| Priority date | — |
| Expiry date | Apr 11, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F2201/88
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
An Input/output (I/O) measurement block facility is provided that creates subchannel measurement blocks (comprising device busy values) related to performance of an I/O operation of a subchannel, wherein a device busy time value is a sum of time intervals when the subchannel is device busy during an attempt to initiate any one of a start function or a resume function at the subchannel.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.