Retro-reflective target wafer for a position determination system
US7373726B2 · kind B2 · utility
1Cited by
14References
20Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Oct 27, 2006 |
| Grant date | May 20, 2008 |
| Priority date | — |
| Expiry date | Nov 24, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B2210/303
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A target that is usable in a position determination system such as, for example, a wheel alignment system, is structurally stable over wide temperature ranges, protected from humidity and chemical contamination, and not subject to breakage. A layered target structure includes a substrate board, a retro-reflective layer formed on the substrate board, a transparent sheet overlaying the retro-reflective layer, and an opaque patterned layer between the a retro-reflective layer and the transparent sheet. The layered target structure may be secured a support assembly.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.