Effect-particle orientation and apparatus therefor
US7375335B2 · kind B2 · utility
2Cited by
20References
23Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Oct 7, 2004 |
| Grant date | May 20, 2008 |
| Priority date | — |
| Expiry date | Nov 14, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/55
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and apparatus for determining the effect-particle orientation in a film or coating are disclosed. The method comprises using opposing directional reflectance measurements, preferably in continuous processes and allows for an on-line evaluation system to provide more specific control over particle orientation, thereby allowing for better color matching between and among various panels or articles.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.