Methods for measuring magnetostriction in magnetoresistive elements
US7375513B2 · kind B2 · utility
1Cited by
5References
19Claims
0Family size
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Key dates
| Filing date | Oct 1, 2007 |
| Grant date | May 20, 2008 |
| Priority date | — |
| Expiry date | Oct 1, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R33/18
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for measuring a magnetostriction value of a magnetoresistive element according to one embodiment includes placing a substrate carrying one or more magnetoresistive elements on a fixture; applying a first magnetic field about parallel to the substrate; applying a second magnetic field about perpendicular to the substrate and about parallel to magnetoresistive layers of the one or more elements; measuring a signal from at least one of the one or more elements; applying a mechanical stress to the substrate; and monitoring the signal from the at least one of the one or more elements while changing the first magnetic field.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.