Method for the adjustment of a light source in a microscope

US7382530B2 · kind B2 · utility

Assignee

• Carl Zeiss Micromanaging GmbH · DE

Inventors

• Jan Thirase · Oettingen, DE
• Bruene Venus · Oettingen, DE

Key dates

• Filing date: Oct 6, 2006
• Grant date: Jun 3, 2008
• Expiry date: Nov 25, 2026

Classification

• Technology area (CPC G): Physics
• CPC primary: G02B2207/113
• WIPO field: Optics
• WIPO sector: Instruments

Abstract

A method by which the illumination radiation to be coupled into the illumination beam path of a microscope can be exactly monitored and/or adjusted. In the method for adjusting a light source for a microscope, an imaging optical reflection unit, instead of the objective, is coupled to the microscope in order to image the light of the light source on a detector in such a way that a monitoring of the focus position and/or the position and/or an adjustment of the laser light source with respect to the focus position and/or the position can be carried out. Provided is an approach for monitoring and adjusting a laser beam to be coupled into the illumination beam path of a microscope particularly for using TIRF effects. It can also be used in principle for other solutions in which the parallelism of illumination beams must be monitored and/or adjusted.