Multi-image feature matching using multi-scale oriented patches
US7382897B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 27, 2004 |
| Grant date | Jun 3, 2008 |
| Priority date | — |
| Expiry date | Mar 26, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V10/7515
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A system and process for identifying corresponding points among multiple images of a scene is presented. This involves a multi-view matching framework based on a new class of invariant features. Features are located at Harris corners in scale-space and oriented using a blurred local gradient. This defines a similarity invariant frame in which to sample a feature descriptor. The descriptor actually formed is a bias/gain normalized patch of intensity values. Matching is achieved using a fast nearest neighbor procedure that uses indexing on low frequency Haar wavelet coefficients. A simple 6 parameter model for patch matching is employed, and the noise statistics are analyzed for correct and incorrect matches. This leads to a simple match verification procedure based on a per feature outlier distance.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.