Acquiring test data from an electronic circuit
US7383146B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 19, 2006 |
| Grant date | Jun 3, 2008 |
| Priority date | — |
| Expiry date | Jan 19, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/2294
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Methods, systems, and computer program products are disclosed for acquiring test data from an electronic circuit by mounting a probe adjacent to a capture point on an electronic circuit board, capturing by the probe an electronic signal of the electronic circuit, digitizing by the probe the captured signal, and transmitting by the probe the digitized signal from the probe through a data communications connection to a remote device. Acquiring test data from an electronic circuit also includes storing by the probe the digitized signal in the probe. Acquiring test data from an electronic circuit may include processing by the probe the digitized signal. Acquiring test data from an electronic circuit also may include synchronizing acquisition of test data by the probe with acquisition of test data by one or more other probes.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.