Method and apparatus for testing a functional circuit at speed
US7383481B2 · kind B2 · utility
19Cited by
12References
23Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Apr 7, 2005 |
| Grant date | Jun 3, 2008 |
| Priority date | — |
| Expiry date | May 6, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/318552
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An integrated circuit including functional circuitry; test circuitry connected to the functional circuitry, wherein the test circuitry is arranged to control the testing of the functional circuitry; and clock signal generating circuitry connected to both the functional circuitry and the test circuitry. The test circuitry is arranged to use the clock signal for testing the functional circuitry.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.