Methods of operating ion optics for mass spectrometry
US7385186B2 · kind B2 · utility
4Cited by
33References
25Claims
0Family size
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Key dates
| Filing date | May 13, 2005 |
| Grant date | Jun 10, 2008 |
| Priority date | — |
| Expiry date | Jul 3, 2025 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J49/06
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
In various embodiments, provided are methods for focusing ions for an ion fragmentor, and methods for operating an ion optics assembly. In various embodiments, the present teachings provide methods that substantially maintain the position of the focal point of the an incoming ion beam over a wide range of collision energies, and thereby provide a collimated ion beam for a collision cell over a wide range of energies. In various embodiments, the present teachings provide methods that facilitate decreasing ion transmission losses over a wide range of collision energies.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.