Standard plane sample and optical characteristic measurement system
US7385701B2 · kind B2 · utility
6Cited by
2References
18Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Nov 23, 2005 |
| Grant date | Jun 10, 2008 |
| Priority date | — |
| Expiry date | Jun 6, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2201/128
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A standard plane sample which supplies an optical characteristic measuring device with reference data. The standard plane sample including a sample portion that is measured by the optical characteristic measuring device to supply measurement data, and a recording medium that stores identification data for identifying a kind of the sample portion as well as reference data corresponding to the optical characteristic of the sample portion.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.