Methods and structure for improved testing of embedded systems
US7385927B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 24, 2002 |
| Grant date | Jun 10, 2008 |
| Priority date | — |
| Expiry date | Jun 10, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/2733
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Methods and structure for standardized communication between a test operator, a host system, and an embedded system under test. Test program instructions are designed, written for, and executed on, an embedded system under test in accordance with standard API functions for message exchange. Still further, the invention provides for standards in the user interface to select a desired test, to start the test with defined parameters and to present reply and status information to the test operator. These user interactions are defined in a test configuration language of the present invention and preferably incorporated with the executable image file to define an integral test vehicle file. The present invention thereby reduces test sequence development time by providing standard API functions for message exchange between a host system test application and the system under test and provides for standardized user interaction in a flexible, easily maintained design language.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.