Patent · US Expired

Processes and a device for determining the actual position of a structure of an object to be examined

US7386090B2 · kind B2 · utility

6Cited by
5References
40Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 10, 2003
Grant dateJun 10, 2008
Priority date
Expiry dateJul 10, 2023

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2223/419
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A CT scanner is employed having a first coordinate system called the CT coordinate system related to the CT scanner for determining an actual position of a structure of an object to be examined. A coordinate measuring instrument (MI) is employed which is either a tactile or an optical or multisensor or an ultrasonic coordinate measuring instrument and which has a second coordinate system, the MI coordinate system, related to said coordinate measuring instrument. According to a variant, a) the coordinates of the object are determined in the MI coordinate system, b) the target position of the structure is predefined, c) after steps a) and b) the target position is determined in the MI coordinate system, d) and, the object is positioned in such a way that the target position of the structure comes to lie within a volume detected by the CT scanner using the result of step c).

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.