Patent · US Expired

Analytical instrument with variable apertures for radiation beam

US7386097B2 · kind B2 · utility

5Cited by
5References
31Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 25, 2005
Grant dateJun 10, 2008
Priority date
Expiry dateMar 16, 2026

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N23/20008
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

An X-ray analysis device makes use of a variable aperture for controlling the position and cross section of the X-ray beam. The variable aperture is configured to allow changes in the cross section and/or position of the beam by movement of one aperture component in one direction. In one embodiment, the aperture medium is a perforated disk that is rotated to expose different aperture holes to the beam. In another embodiment, the aperture medium is a perforated tape that is moved in a linear direction to expose different aperture holes to the beam. The tape may be wound about two axes to control its movement, or may be a continuous loop. A cassette may also be used to house the tape.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.