Test module for testing of electronic systems
US7386772B1 · kind B1 · utility
1Cited by
6References
21Claims
0Family size
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Key dates
| Filing date | Dec 20, 2004 |
| Grant date | Jun 10, 2008 |
| Priority date | — |
| Expiry date | Apr 19, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2815
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A test module is provided for testing system modules. All the test circuitry and test connectors reside on the test module. The test module is coupled to the system modules during testing, and is removed from the system after testing. Test connectors and test circuitry on the test module support such test functions as voltage margining, CPU emulation, and JTAG boundary scanning. A JTAG selection function can also be provided for selecting one or more JTAG loops for testing individually or as a single loop. The test module further includes level shifters for converting between 3.3V and 1.2V.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.