Time-of-flight spectrometer with orthogonal pulsed ion detection
US7388193B2 · kind B2 · utility
3Cited by
8References
18Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Jun 22, 2005 |
| Grant date | Jun 17, 2008 |
| Priority date | — |
| Expiry date | Mar 5, 2026 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J49/40
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
This invention provides an apparatus and method for efficient detection of ions in a time-of-flight mass spectrometer. The apparatus of the invention provides for orthogonal deflection of ions in the flight tube of a time of flight mass spectrometer to a detector or detectors positioned along or in the wall of the flight tube of the mass spectrometer. A method of detecting ions utilizing the apparatus is also provided.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.